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National Repository of Grey Literature 2 records found  Search took 0.01 seconds. 
Design of a suitable length standard for nanometology at the CMI Brno and CEITEC Brno
 Češek, Jakub ; Jankových, Róbert (referee) ; Šrámek, Jan (advisor)
The thesis deals with the design of a suitable length standard for nanometrology. This length standard will be used for metrological traceability of the Rigaku nano3DX located at CEITEC Brno and the SIOS NMM-1 device which is located at ČMI Brno. The first part is focused on the description of these measuring instruments, the analysis of their metrological traceability requirements and the requirements for the material length standard. The second part is devoted to the concrete possibilities of the etalon design, 3D printing of the prototype of the standard and verification of its dimensional compatibility. At the end of the thesis, the evaluation and selection of the appropriate standard design is made.
Detailed record
Design of a suitable length standard for nanometology at the CMI Brno and CEITEC Brno
 Češek, Jakub ; Jankových, Róbert (referee) ; Šrámek, Jan (advisor)
The thesis deals with the design of a suitable length standard for nanometrology. This length standard will be used for metrological traceability of the Rigaku nano3DX located at CEITEC Brno and the SIOS NMM-1 device which is located at ČMI Brno. The first part is focused on the description of these measuring instruments, the analysis of their metrological traceability requirements and the requirements for the material length standard. The second part is devoted to the concrete possibilities of the etalon design, 3D printing of the prototype of the standard and verification of its dimensional compatibility. At the end of the thesis, the evaluation and selection of the appropriate standard design is made.
Detailed record

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